Features
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INL/DNL measurement of a 14-bit/65Msps ADC |
The ATX7006 is a fully integrated solution for testing ADCs, DACs and other Analog functions. It combines very high accuracy, low noise and fast sampling with an exceptional ease of use. Traditionally data converters are tested using a whole stack of bench instruments, filters, switch matrices and user made software. Many engineering hours are needed to get reliable results. The ATX7006 is a single instrument for all your data converter testing and test methods.
This means you can concentrate on testing your converters rather than fine-tuning the test set-up. The ATX7006 is capable of testing converters from 4 to 24-bit. Its versatile digital I/O makes interfacing to the DUT easy, even for embedded converters. The Single Reference Architecture improves the stability and reduces calibration effort. The backplane distributed clock ensures coherent measuring.
The ATX7006 is also very suitable as an add-on upgrade for ATE systems.
The ATX7006 is a modular system that can be configured according the user's needs. The available Generator and Digitizer modules cover the range from low speed high accuracy testing to high speed medium accuracy testing. Auxiliary modules provide all other signal needs like Reference voltages, Supply voltages, clocks and Digital IO. The ATX7006 measures linearity parameters just as easy as dynamic parameters, all within the same test set-up.
The system controller runs Windows™ XP-embedded and gives the user full access to software features. For production style testing the ATX7006 can run as slave of an ATE system. For lab measurements a PC is used to control the measure-ment and display the results. There are three communication possibilities; Ethernet, GPIB and USB. The controller supports the Lua scripting language providing an easy way to add user defined test methods and calculation routines.
The ATX7006 has been designed with one important goal in mind: low system noise. It therefore has linear power supplies for the analog section and thorough Shielding and Grounding to maintain analog signal integrity even in a harsh production environment. The DIO module can provide a low jitter sample clock that is distributed to all other modules and to the DUT.
The standard 20-bit Generator and Digitizer modules offer an outstanding DC accuracy in combination with better than 106dB dynamic performance at sample rates up to 2Msps. The 16-bit modules allow testing up to 400Msps. The ATX7006 features auto calibration and built-in self test.